Optical Thin Film Characterization Service

K Lab provide high quality optical thin film characterization service

• For the wavelength range of 175 - 3200nm
• Reflection and Transmission Measurements 
• Single layer thickness and index measurements
• Multi-layer thickness and indexes measurements / simulations
• Up to 6" wafer mapping

Any Questions? Please email us: info@klabcorp.com

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Last modified: May 19, 2004